共找到 110 條與 無線電計量 相關(guān)的標(biāo)準(zhǔn),共 8 頁
本標(biāo)準(zhǔn)規(guī)定了居民身份證閱讀器的術(shù)語、定義與縮略語,計量性能要求,功能要求,通用技術(shù)要求,校準(zhǔn)條件,校準(zhǔn)項目和校準(zhǔn)方法,校準(zhǔn)結(jié)果的處理及復(fù)校時間間隔。本標(biāo)準(zhǔn)適用于作為計量器具使用的居民身份證閱讀器的首次校準(zhǔn)、后續(xù)校準(zhǔn)和使用中檢驗。
Calibration specifications for readers of the Resident Identity Card
This basic standard applies to radio base stations and fixed terminal stations for wireless telecommunication systems as defined in Clause 4, operating in the frequency range 110 MHz to 40 GHz. The objective of the standard is to specify, for such equipment, the method for assessment of compliance distances according to the basic restrictions (directly or indirectly via compliance with reference levels) related to human exposure to radio frequency electromagnetic fields.
Basic standard for the calculation and measurement of electromagnetic field strength and SAR related to human exposure from radio base stations and fixed terminal stations for wireless telecommunication systems (110 MHz - 40 GHz)
本檢定系統(tǒng)表適用于射頻與微波衰減計量器具的量值傳遞,它包括從主要基本量、射頻與微波衰減計量基準(zhǔn)器具、射頻與微波衰減計量標(biāo)準(zhǔn)器具直至射頻與微波衰減工作計量器具之間的量值傳遞關(guān)系、量值傳遞方法和量值傳遞時的不確定度要求。
Verification Scheme of Measuring Instruments for RF and Microwave Attenuation
無線電計量名詞術(shù)語及定義
Terms and Their Definitions for Radio Measurement
本標(biāo)準(zhǔn)規(guī)定了全尺寸準(zhǔn)動態(tài)近場目標(biāo)電磁散射特性測試的方法。 本標(biāo)準(zhǔn)適用于近場目標(biāo)動態(tài)電磁散射特性測試、無線電引信彈目交會仿真試驗及引戰(zhàn)配合模擬試驗,其它體制引信及引戰(zhàn)配合也可參照使用。
The quasi-dynamic measuring methods of Near Field electromagnetic scattering characteristics for full scale targets
本標(biāo)準(zhǔn)規(guī)定了目標(biāo)近場微波和毫米波電磁輻射特性的測試方法及技術(shù)要求、測試系統(tǒng)狀態(tài)設(shè)置、系統(tǒng)定標(biāo)等要求。 本標(biāo)準(zhǔn)適用于目標(biāo)或其部件的近場微波和毫米波電磁輻射測試。
The radiation measuring methods of targets on microwave or millimeter wave in near field
Calibration Specification for Vector Signal Analyzers
Calibration Specification for Modulation Meters
Verification Regulation of Oscilloscope Calibrators
CTS-700 SELCAL/ATSCALL Test Set
Model T1200 Control Display Unit Tester
Verification Regulation of Spectrum Analyzers
Verification Regulation of Digital Electroencephalogram Mapping and Brain Electric Acting Mapping
Verification Regulation of Logic Analyzer
This specification establishes the specific requirements for the organic mounting structure used to interconnect chip components, which in combination form the completed functional Organic Single-chip Module (SCM-L) or Organic Multichip Module (MCM-L) assembly, and the quality and reliability assurance requirements that must be met for their acquisition.
IPC-A-30 - Flexible Circuits Test Pattern
Verification Regulation of 0Hz~30MHz Variable Attenuator
Verification Regulation of Distortion Meter Calibrator
Verification Regulation of Level Oscillator
Verification Regulation of Calibration Device for Electrocaldiograph and Electroencephalograph
Verification Regulation of Low Frequency Signal Generator
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