由多個(gè)晶體顆粒組成的半導(dǎo)體材料,表面易受金屬污染影響電子特性,廣泛應(yīng)用于太陽(yáng)能電池和電子元器件制造領(lǐng)域。
標(biāo)準(zhǔn)號(hào) & 類別 | 標(biāo)準(zhǔn)名稱 | 發(fā)布 |
---|---|---|
ASTM F1724-01 試驗(yàn) |
Determination of Metal Contamination on Polysilicon Surface by Acid Extraction Atomic Absorption Spectrometry
石墨爐原子吸收光譜法 |
2001 美國(guó)材料與試驗(yàn)協(xié)會(huì) |
ASTM F574-88 試驗(yàn) |
Evaluating polysilicon
|
1988 美國(guó)材料與試驗(yàn)協(xié)會(huì) |
DB1502/T 026-2024 規(guī)范 |
Energy management specifications for polysilicon production enterprises
能源管理 |
2024-08-21 |
DB1502/T 027-2024 規(guī)范 |
Energy consumption limit per unit product in polysilicon production
|
2024-08-21 |
GB 51034-2014 規(guī)范 |
Code for design of polysilicon plant
|
2014-08-27 國(guó)家住房和城鄉(xiāng)建設(shè)部 |
GB/T 18916.47-2020 規(guī)范 |
Norm of water intake—Part 47: Polysilicon production
取水定額 水平衡測(cè)試 |
2020-03-31 國(guó)家質(zhì)檢總局 |
GB/T 24579-2009 試驗(yàn)方法標(biāo)準(zhǔn) |
Test methods for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy
|
2009-10-30 國(guó)家質(zhì)檢總局 |
GB/T 24582-2023 試驗(yàn) |
多晶硅表面金屬雜質(zhì)含量測(cè)定 酸浸取-電感耦合等離子體質(zhì)譜法 Determination of metal impurity content on polysilicon surface by acid leaching-inductively coupled plasma mass spectrometry
|
2023-08-06 國(guó)家質(zhì)檢總局 |
GB/T 33236-2016 試驗(yàn) |
多晶硅 痕量元素化學(xué)分析 輝光放電質(zhì)譜法 Polycrystalline silicon—Determination of trace elements—Glow discharge mass spectrometry method
雜質(zhì)元素 |
2016-12-13 國(guó)家質(zhì)檢總局 |
GB/T 38907-2020 規(guī)范 |
Water saving enterprises—Polysilicon industry
節(jié)水型企業(yè) |
2020-06-02 國(guó)家質(zhì)檢總局 |
GB/T 4059-2018 試驗(yàn) |
Test method for phosphorus content in polycrystalline silicon by zone-melting method under controlled atmosphere
|
2018-12-28 國(guó)家質(zhì)檢總局 |
GB/T 4060-2018 試驗(yàn)/規(guī)范 |
Test method for boron content in polycrystalline silicon by vacuum zone-melting method
|
2018-09-17 國(guó)家質(zhì)檢總局 |
JB/T 12067-2014 規(guī)范標(biāo)準(zhǔn) |
TDL-GX silicon core growing furnace
|
2014-07-09 行業(yè)標(biāo)準(zhǔn)-機(jī)械 |
T/CESA 1082-2020 規(guī)范 |
Assessment requirements for green factory in polycrystalline silicon manufacturing industry
|
2020-06-20 中國(guó)團(tuán)體標(biāo)準(zhǔn) |
T/ZZB 0648-2018 規(guī)范 |
200 mm heavily phosphorus-doped single crystalline Czochralski silicon polished wafers
|
2018-10-19 中國(guó)團(tuán)體標(biāo)準(zhǔn) |
YS/T 1195-2017 規(guī)范 |
Silicon tetrachloride, a by-product of polysilicon
|
2017-07-07 行業(yè)標(biāo)準(zhǔn)-有色金屬 |
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